XPSPEAK is a Windows program oriented toward material scientists. It provides advanced peak fitting capabilities to accurately deconvolute X-ray photoelectron spectroscopy results. Supported export file formats include CSV and ASCII. Please note that XPSPEAK is obsolete and no longer supported by the developer. The installation files are not available.

Peak fitting process

You can employ Gaussian, Lorentzian and pseudo-Voigt functions to model individual spectral features. There are instruments for manipulating XPS data by smoothing outstanding values, correcting the baseline and calibrating energy input. This is helpful for enhancing the readability of spectra graphs and facilitating quick peak identification.

Advanced tools

Like in Renishaw WIRE, users are able to overlay multiple samples for comparison and trend analysis. It is possible to find elemental variations and compositional changes. Moreover, tools for determining the position, width, area and intensity of separate XPS peaks are provided.

The software helps you perform complex statistical analysis operations to find optimal material parameters. Additionally, an option to view detailed information about detected chemical bonding properties is available.

Features

free to download and use;
contains instruments for X-ray photoelectron spectral analysis;
there is support for multiple peak fitting methods;
you can compare several samples of the same material to identify potential inconsistencies;
compatible with all modern versions of Windows.